Excitation Principle

DW-EDX3000 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured. The working principle is as follows:

Technical Specifications

Measurement precision	0.05%(≥96%)
Analysis range	1ppm-99.99%
Analytical range of elements	More than 60 elements from potassium (K) to uranium (U)
Measuring object	powder, solid and liquid
Measurement time	(60~300)s
Ambient temperature range	(15-30)t)
Relative humidity	W70%
Weight	30kg
Working voltage	AC 110V/220V
Configuration	Single sample chamber
	Si PIN semiconductor detector
	Amplifier circuit
	High and low voltage power supplies
	X-ray tube
	Non-vacuum chamber

Characteristic X-radiation of Element

Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.

Scattering

It is the background of the spectrum.

Photoelement

The photoelectron is the foundation of the detector. In the sample, the X-ray intensity of every element is expressed as I1,I2,I3,I4,I5……respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:

This equation is too complicated and can be simplified as:

C=KlI1+KI2+KI3+K4I4+K5I5……

Where

C is the element content in the sample; I1,I2,I3,I4,I5……arc X-ray intensity of element respectively; K1,K2, K3.K4,K5 are coefficients which can be determined by measuring known standard sample to calibrate.

The Spectrum of Recovered Pt

Element	Content(%)	Element	Contenl(%)
Cr	0.001	Fe	0.001
Ru	2.011	Ni	0.218
Rh	13.25	Co	0.011
Pd	10.125	Cu	0.207
Ag	0.781	Zn	0.221
Ir	3.104	Au	2.302
Pt	77.816	In	2.011