Energy Dispersion X-ray Fluorescence Spectrometer (DW-NP-5010)
DW-NP-5010 energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.
Main Component of the X-ray Fluorescence Spectrometer:
- Si(PIN) or SDD detector
- Multi-channel analyzer
- Power controller
- X-ray tube
- High voltage generator
- The automatic filter conversion system
- Radiation shielded system
- The detection limit of harmful elements Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction
- Powerful analysis software workstation
Features of DW-NP-5010 Spectrometer:
- It can do qualitative, quantitative and no sample analysis. Such as block samples, powder or liquid samples, from the 4th element in the periodic table beryllium (Be) to the 92rd element uranium (U), almost all of the elements can be accurately analyzed.
- The analytical concentration range can be from 0.1 PPM to 100%, and even up to 100% of the element concentration can be directly measured without dilution.
- XRF analysis method has the advantages of simple sample preparation, wide determination range of elements, high determination accuracy, good reproducibility, fast measurement speed (the 30s-900s), no environmental pollution and no destruction of samples.
Specifications of DW-NP-5010 X-ray Fluorescence Spectrometer
| Model | DW-NP-5010 | |
| Analysis principle | Energy-dispersive X-ray fluorescence analysis | |
| Element measuring range | Any element from K-U | |
| Min. measuring limit | Cd/Hg/Br/Cr/Pb≤2 ppm | |
| Sample shape | Arbitrary size, any irregular shape | |
| Sample type | Plastic/metal/film/powder/liquid etc | |
| X ray tube | Target material | Mo |
| Tube voltage | 5─50KV | |
| Tube current | 1─1000ｕA | |
| Sample exposure diameter | 2, 5, 8mm | |
| Detector | Si-PIN or SDD detector, high speed pulse height analysis system | |
| High voltage generator | Special HV generator for X fluorescence | |
| ADC | 2048 channels | |
| Filter | 6 filters are automatically selected and converted. | |
| Sample observation | 200×color CCDcamera | |
| Analysis software | Patented software products, free upgrade for life | |
| Analysis method | Theoretical α coefficient method,basic parameter method, empirical coefficient method | |
| Analysis time | 30-900seconds, adjustable | |
| Operating system software | WINDOWS XP | |
| Data processing system | Host | PC business model |
| CPU | ≥2.8G | |
| Memory | ≥2g | |
| CD-ROM | 8xDVD | |
| Hard disk | ≥500G | |
| Display | 22’’ or 24’’ LCD display | |
| Working environment | Temperature 10－35С，humidity 30－70％RH | |
DW-NP-5010 Spectrometer Display
