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  • 1386602534321451009
  • 1386602533985906689
  • 1386602534006878209
  • 1386602534006878210
  • 1386602534006878211
  • 1386602534036238337
  • 1386602534073987074

    • Energy Dispersion X-ray Fluorescence Spectrometer (DW-NP-5010)

    DW-NP-5010 energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.

    DW-NP-5010 Manual
    DW-NP-5010 Brochure

    Main Component of the X-ray Fluorescence Spectrometer:

    1. Si(PIN) or SDD detector
    2. Multi-channel analyzer
    3. Power controller
    4. X-ray tube
    5. High voltage generator
    6. The automatic filter conversion system
    7. Radiation shielded system
    8. The detection limit of harmful elements Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction
    9. Powerful analysis software workstation

    Features of DW-NP-5010 Spectrometer:

    1. It can do qualitative, quantitative and no sample analysis. Such as block samples, powder or liquid samples, from the 4th element in the periodic table beryllium (Be) to the 92rd element uranium (U), almost all of the elements can be accurately analyzed.
    2. The analytical concentration range can be from 0.1 PPM to 100%, and even up to 100% of the element concentration can be directly measured without dilution.
    3. XRF analysis method has the advantages of simple sample preparation, wide determination range of elements, high determination accuracy, good reproducibility, fast measurement speed (the 30s-900s), no environmental pollution and no destruction of samples.

    Specifications of DW-NP-5010 X-ray Fluorescence Spectrometer

    Model DW-NP-5010
    Analysis principle Energy-dispersive X-ray fluorescence analysis
    Element measuring range Any element from Na(11)-U(92)
    Min. measuring limit Cd/Hg/Br/Cr/Pb≤2 ppm
    Sample shape Arbitrary size, any irregular shape
    Sample type Plastic/metal/film/powder/liquid etc
    X ray tube Target material Mo
    Tube voltage 5─50KV
    Tube current 1─1000ｕA
    Sample exposure diameter 2, 5, 8mm
    Detector Si-PIN or SDD detector, high speed pulse height analysis system
    High voltage generator Special HV generator for X fluorescence
    ADC 2048 channels
    Filter 6 filters are automatically selected and converted.
    Sample observation 200×color CCDcamera
    Analysis software Patented software products, free upgrade for life
    Analysis method Theoretical α coefficient method,basic parameter method, empirical coefficient method
    Analysis time 30-900seconds, adjustable
    Operating system software WINDOWS XP
    Data processing system Host PC business model
    CPU ≥2.8G
    Memory ≥2g
    CD-ROM 8xDVD
    Hard disk ≥500G
    Display 22’’ or 24’’ LCD display
    Working environment Temperature 10－35С，humidity 30－70％RH

    DW-NP-5010 Spectrometer Display

    Energy Dispersion X-ray Fluorescence Spectrometer

    Other X-Ray Fluorescence Spectrometer (XRF)