Energy Dispersion X-ray Fluorescence Spectrometer (DW-NP-5010)

DW-NP-5010 energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.

Main Component of the X-ray Fluorescence Spectrometer:

  1. Si(PIN) or SDD detector
  2. Multi-channel analyzer
  3. Power controller
  4. X-ray tube
  5. High voltage generator
  6. The automatic filter conversion system
  7. Radiation shielded system
  8. The detection limit of harmful elements Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction
  9. Powerful analysis software workstation

Features:

  1. It can do qualitative, quantitative and no sample analysis. Such as block samples, powder or liquid samples, from the 4th element in the periodic table beryllium (Be) to the 92rd element uranium (U), almost all of the elements can be accurately analyzed.
  2. The analytical concentration range can be from 0.1 PPM to 100%, and even up to 100% of the element concentration can be directly measured without dilution.
  3. XRF analysis method has the advantages of simple sample preparation, wide determination range of elements, high determination accuracy, good reproducibility, fast measurement speed (the 30s-900s), no environmental pollution and no destruction of samples.

Specifications of DW-NP-5010 X-ray Fluorescence Spectrometer

Model DW-NP-5010
Analysis principle Energy-dispersive X-ray fluorescence analysis
Element measuring range Any element from Na(11)-U(92)
Min. measuring limit Cd/Hg/Br/Cr/Pb≤2 ppm
Sample shape Arbitrary size, any irregular shape
Sample type Plastic/metal/film/powder/liquid etc
X ray tube Target material Mo
Tube voltage 5─50KV
Tube current 1─1000uA
Sample exposure diameter 2, 5, 8mm
Detector Si-PIN or SDD detector, high speed pulse height analysis system
High voltage generator Special HV generator for X fluorescence
ADC 2048 channels
Filter 6 filters are automatically selected and converted.
Sample observation 200×color CCDcamera
Analysis software Patented software products, free upgrade for life
Analysis method Theoretical α coefficient method,basic parameter method, empirical coefficient method
Analysis time 30-900seconds, adjustable
Operating system software WINDOWS XP
Data processing system Host PC business model
CPU ≥2.8G
Memory ≥2g
CD-ROM 8xDVD
Hard disk ≥500G
Display 22’’ or 24’’ LCD display
Working environment Temperature 10-35С,humidity 30-70%RH

Product Display

Energy Dispersion X-ray Fluorescence Spectrometer

Ohter X-Ray Fluorescence Spectrometer (XRF)